
IDT / ICS VCXO-TO-LVCMOS OUTPUTS
7
ICS81006AK REV. B OCTOBER 8, 2008
ICS81006
VCXO-TO-6 LVCMOS OUTPUTS
PARAMETER MEASUREMENT INFORMATION
SCOPE
Qx
LVCMOS
GND
3.3V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT
2.05V±5%
V
DDO
-1.25V±5%
V
DD
1.25V±5%
3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT
SCOPE
Qx
LVCMOS
GND
1.65V±5%
-1.65V±5%
V
DD,
V
DDO
3.3V CORE/1.8V OUTPUT LOAD AC TEST CIRCUIT
2.5V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT
2.5 CORE/1.8V OUTPUT LOAD AC TEST CIRCUIT
RMS PHASE JITTER
SCOPE
Qx
LVCMOS
GND
2.4V±0.065V
V
DDO
-0.9V±0.1V
V
DD
0.9V±0.1V
SCOPE
Qx
LVCMOS
GND
1.25V±5%
-1.25V±5%
V
DD,
V
DDO
Phase Noise Mask
Offset Frequency
f
1
f
2
Phase Noise Plot
RMS Jitter = Area Under the Masked Phase Noise Plot
Noise
P
o
w
er
SCOPE
Qx
LVCMOS
GND
1.6V±0.025V
V
DDO
-0.9V±0.1V
V
DD
0.9V±0.1V